Born in 1635 into a poor family, Hooke studied at Oxford University. Worked as architect and surveyor in London after the Great Fire. Became Curator of Experiments at Royal Society, later becoming full fellow
Louis de Broglie proposed electron waves in 1924. Max Knoll and Ernst Ruska developed first electron microscope in 1931. Manfred von Ardenne and Charles Oatley laid foundations for electron microscopy. Stigmator invention in 1946 accelerated development after WWII
SEM scans sample surface with focused electron beam to produce images. Secondary electrons detected using Everhart-Thornley detector. Resolution can reach resolutions better than 1 nanometer. Magnification ranges from 10 to over 500,000 times
Electron microscope uses electron beam as illumination source. Electron optics control beam for magnification and diffraction patterns. Resolution is about 0.1 nm compared to 200 nm for light microscopes
Condensers convert divergent light into parallel beams for imaging. Essential components of microscopes, telescopes, and other imaging devices. Light passes through diaphragm and lenses to illuminate specimen
Standard microscope slide measures 75x25mm and is about 1mm thick. Slides are made of optical quality glass or specialty plastics. Slides are held on microscope stage using clips, clamps or cross-table